S. Martin, Vincent Olive. Embedded test environment. In Seventh IEEE International Workshop on Rapid System Prototyping (RSP '96), Thessaloniki, Greece, June 19-21, 1996. pages 50-54, IEEE Computer Society, 1996. [doi]
@inproceedings{MartinO96,
title = {Embedded test environment},
author = {S. Martin and Vincent Olive},
year = {1996},
doi = {10.1109/IWRSP.1996.506726},
url = {http://doi.ieeecomputersociety.org/10.1109/IWRSP.1996.506726},
researchr = {https://researchr.org/publication/MartinO96},
cites = {0},
citedby = {0},
pages = {50-54},
booktitle = {Seventh IEEE International Workshop on Rapid System Prototyping (RSP '96), Thessaloniki, Greece, June 19-21, 1996},
publisher = {IEEE Computer Society},
isbn = {0-8186-7603-5},
}