Low cost fault detector guided by permanent faults at the end of FPGAs life cycle

Victor M. Goncalves Martins, Frederico Ferlini, Djones Vinicius Lettnin, Eduardo Augusto Bezerra. Low cost fault detector guided by permanent faults at the end of FPGAs life cycle. In 15th Latin American Test Workshop - LATW 2014, Fortaleza, Brazil, March 12-15, 2014. pages 1-6, IEEE, 2014. [doi]

Authors

Victor M. Goncalves Martins

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Frederico Ferlini

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Djones Vinicius Lettnin

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Eduardo Augusto Bezerra

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