A Low-Power Radiation-Hardened Flip-Flop with Stacked Transistors in a 65 nm FDSOI Process

Haruki Maruoka, Masashi Hifumi, Jun Furuta, Kazutoshi Kobayashi. A Low-Power Radiation-Hardened Flip-Flop with Stacked Transistors in a 65 nm FDSOI Process. IEICE Transactions, 101-C(4):273-280, 2018. [doi]

@article{MaruokaHFK18,
  title = {A Low-Power Radiation-Hardened Flip-Flop with Stacked Transistors in a 65 nm FDSOI Process},
  author = {Haruki Maruoka and Masashi Hifumi and Jun Furuta and Kazutoshi Kobayashi},
  year = {2018},
  url = {http://search.ieice.org/bin/summary.php?id=e101-c_4_273},
  researchr = {https://researchr.org/publication/MaruokaHFK18},
  cites = {0},
  citedby = {0},
  journal = {IEICE Transactions},
  volume = {101-C},
  number = {4},
  pages = {273-280},
}