Dark current and noise of 100nm thick silicon on sapphire CMOS lateral PIN photodiodes

Miriam Adlerstein Marwick, Francisco Tejada, Philippe O. Pouliquen, Eugenio Culurciello, Kim Strohbehn, Andreas G. Andreou. Dark current and noise of 100nm thick silicon on sapphire CMOS lateral PIN photodiodes. In International Symposium on Circuits and Systems (ISCAS 2006), 21-24 May 2006, Island of Kos, Greece. IEEE, 2006. [doi]

@inproceedings{MarwickTPCSA06,
  title = {Dark current and noise of 100nm thick silicon on sapphire CMOS lateral PIN photodiodes},
  author = {Miriam Adlerstein Marwick and Francisco Tejada and Philippe O. Pouliquen and Eugenio Culurciello and Kim Strohbehn and Andreas G. Andreou},
  year = {2006},
  doi = {10.1109/ISCAS.2006.1693650},
  url = {http://dx.doi.org/10.1109/ISCAS.2006.1693650},
  researchr = {https://researchr.org/publication/MarwickTPCSA06},
  cites = {0},
  citedby = {0},
  booktitle = {International Symposium on Circuits and Systems (ISCAS 2006), 21-24 May 2006, Island of Kos, Greece},
  publisher = {IEEE},
}