Properties of pairs of test vectors detecting path delay faults in high performance VLSI logical circuits

Anzhela Yu. Matrosova, Valeriy B. Lipskii. Properties of pairs of test vectors detecting path delay faults in high performance VLSI logical circuits. Automation and Remote Control, 76(4):658-667, 2015. [doi]

@article{MatrosovaL15,
  title = {Properties of pairs of test vectors detecting path delay faults in high performance VLSI logical circuits},
  author = {Anzhela Yu. Matrosova and Valeriy B. Lipskii},
  year = {2015},
  doi = {10.1134/S0005117915040104},
  url = {https://doi.org/10.1134/S0005117915040104},
  researchr = {https://researchr.org/publication/MatrosovaL15},
  cites = {0},
  citedby = {0},
  journal = {Automation and Remote Control},
  volume = {76},
  number = {4},
  pages = {658-667},
}