Anzhela Matrosova, Eugeniy Mitrofanov. Pseudo-exhaustive testing of sequential circuits for multiple stuck-at faults. In 2016 IEEE East-West Design & Test Symposium, EWDTS 2016, Yerevan, Armenia, October 14-17, 2016. pages 1-4, IEEE, 2016. [doi]
@inproceedings{MatrosovaM16, title = {Pseudo-exhaustive testing of sequential circuits for multiple stuck-at faults}, author = {Anzhela Matrosova and Eugeniy Mitrofanov}, year = {2016}, doi = {10.1109/EWDTS.2016.7807694}, url = {http://dx.doi.org/10.1109/EWDTS.2016.7807694}, researchr = {https://researchr.org/publication/MatrosovaM16}, cites = {0}, citedby = {0}, pages = {1-4}, booktitle = {2016 IEEE East-West Design & Test Symposium, EWDTS 2016, Yerevan, Armenia, October 14-17, 2016}, publisher = {IEEE}, isbn = {978-1-5090-0693-9}, }