A Test Structure for Two-Dimensional Analysis of MOSFETs by Hot-Carrier-Induced Photoemission - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Toshihiro Matsuda, Hiroaki Takeuchi, Akira Muramatsu, Hideyuki Iwata, Takashi Ohzone, Kyoji Yamashita, Norio Koike, Ken-ichiro Tatsuuma. A Test Structure for Two-Dimensional Analysis of MOSFETs by Hot-Carrier-Induced Photoemission. IEICE Transactions, 88-C(5):811-816, 2005. [doi]

This author has not been identified. Look up 'Toshihiro Matsuda' in GoogleThis author has not been identified. Look up 'Hiroaki Takeuchi' in GoogleThis author has not been identified. Look up 'Akira Muramatsu' in GoogleThis author has not been identified. Look up 'Hideyuki Iwata' in GoogleThis author has not been identified. Look up 'Takashi Ohzone' in GoogleThis author has not been identified. Look up 'Kyoji Yamashita' in GoogleThis author has not been identified. Look up 'Norio Koike' in GoogleThis author has not been identified. Look up 'Ken-ichiro Tatsuuma' in Google

runs on WebDSL