Dynamic Scheduling Approaches to Wafer Test Scheduling with Unpredictable Error

Tsubasa Matsuo, Masahiro Inuiguchi, Kenichiro Masunaga. Dynamic Scheduling Approaches to Wafer Test Scheduling with Unpredictable Error. JACIII, 17(4):526-534, 2013. [doi]

@article{MatsuoIM13,
  title = {Dynamic Scheduling Approaches to Wafer Test Scheduling with Unpredictable Error},
  author = {Tsubasa Matsuo and Masahiro Inuiguchi and Kenichiro Masunaga},
  year = {2013},
  url = {http://www.fujipress.jp/finder/xslt.php?mode=present&inputfile=JACII001700040007.xml},
  researchr = {https://researchr.org/publication/MatsuoIM13},
  cites = {0},
  citedby = {0},
  journal = {JACIII},
  volume = {17},
  number = {4},
  pages = {526-534},
}