Matthew Mayhew, Radu Muresan. Modeling the effect of NMOS gate capacitance in an on-chip decoupling capacitor PAA countermeasure. In IEEE 57th International Midwest Symposium on Circuits and Systems, MWSCAS 2014, College Station, TX, USA, August 3-6, 2014. pages 121-124, IEEE, 2014. [doi]
@inproceedings{MayhewM14-0,
title = {Modeling the effect of NMOS gate capacitance in an on-chip decoupling capacitor PAA countermeasure},
author = {Matthew Mayhew and Radu Muresan},
year = {2014},
doi = {10.1109/MWSCAS.2014.6908367},
url = {https://doi.org/10.1109/MWSCAS.2014.6908367},
researchr = {https://researchr.org/publication/MayhewM14-0},
cites = {0},
citedby = {0},
pages = {121-124},
booktitle = {IEEE 57th International Midwest Symposium on Circuits and Systems, MWSCAS 2014, College Station, TX, USA, August 3-6, 2014},
publisher = {IEEE},
isbn = {978-1-4799-4134-6},
}