Classification by CUT: Clearance under Threshold - researchr publication authors

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Ryan McBride, Ke Wang, Wenyuan Li. Classification by CUT: Clearance under Threshold. In Ravi Kumar, Hannu Toivonen, Jian Pei, Joshua Zhexue Huang, Xindong Wu, editors, 2014 IEEE International Conference on Data Mining, ICDM 2014, Shenzhen, China, December 14-17, 2014. pages 410-419, IEEE, 2014. [doi]

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