Risk Clearance with Guaranteed Precision

Ryan McBride, Ke Wang, Viswanadh Nekkanti, Wenyuan Li. Risk Clearance with Guaranteed Precision. In Nitesh Chawla, Wei Wang 0010, editors, Proceedings of the 2017 SIAM International Conference on Data Mining, Houston, Texas, USA, April 27-29, 2017. pages 36-44, SIAM, 2017. [doi]

@inproceedings{McBrideWNL17,
  title = {Risk Clearance with Guaranteed Precision},
  author = {Ryan McBride and Ke Wang and Viswanadh Nekkanti and Wenyuan Li},
  year = {2017},
  doi = {10.1137/1.9781611974973.5},
  url = {https://doi.org/10.1137/1.9781611974973.5},
  researchr = {https://researchr.org/publication/McBrideWNL17},
  cites = {0},
  citedby = {0},
  pages = {36-44},
  booktitle = {Proceedings of the 2017 SIAM International Conference on Data Mining, Houston, Texas, USA, April 27-29, 2017},
  editor = {Nitesh Chawla and Wei Wang 0010},
  publisher = {SIAM},
  isbn = {978-1-61197-497-3},
}