Jon McElvain, Scott P. Campbell, Jonathan Miller, Elaine W. Jin. Texture-based measurement of spatial frequency response using the dead leaves target: extensions, and application to real camera systems. In Francisco H. Imai, Nitin Sampat, Feng Xiao, editors, Digital Photography VI, part of the IS&T-SPIE Electronic Imaging Symposium, San Jose, CA, USA, January 18-19, 2010, Proceedings. Volume 7537 of SPIE Proceedings, pages 75370, SPIE, 2010. [doi]
@inproceedings{McElvainCMJ10,
title = {Texture-based measurement of spatial frequency response using the dead leaves target: extensions, and application to real camera systems},
author = {Jon McElvain and Scott P. Campbell and Jonathan Miller and Elaine W. Jin},
year = {2010},
doi = {10.1117/12.838698},
url = {http://dx.doi.org/10.1117/12.838698},
tags = {rule-based},
researchr = {https://researchr.org/publication/McElvainCMJ10},
cites = {0},
citedby = {0},
pages = {75370},
booktitle = {Digital Photography VI, part of the IS&T-SPIE Electronic Imaging Symposium, San Jose, CA, USA, January 18-19, 2010, Proceedings},
editor = {Francisco H. Imai and Nitin Sampat and Feng Xiao},
volume = {7537},
series = {SPIE Proceedings},
publisher = {SPIE},
isbn = {978-0-8194-7930-3},
}