Gordon R. McLeod. Built-in System Test and Fault Location. In Proceedings IEEE International Test Conference 1994, TEST: The Next 25 Years, Washington, DC, USA, October 2-6, 1994. pages 291-299, IEEE Computer Society, 1994.
@inproceedings{McLeod94,
title = {Built-in System Test and Fault Location},
author = {Gordon R. McLeod},
year = {1994},
tags = {testing},
researchr = {https://researchr.org/publication/McLeod94},
cites = {0},
citedby = {0},
pages = {291-299},
booktitle = {Proceedings IEEE International Test Conference 1994, TEST: The Next 25 Years, Washington, DC, USA, October 2-6, 1994},
publisher = {IEEE Computer Society},
isbn = {0-7803-2103-0},
}