David Mease, Vijayan N. Nair. Extreme (X-)Testing With Binary Data and Applications to Reliability Demonstration. Technometrics, 48(3):399-410, 2006. [doi]
@article{MeaseN06,
title = {Extreme (X-)Testing With Binary Data and Applications to Reliability Demonstration},
author = {David Mease and Vijayan N. Nair},
year = {2006},
doi = {10.1198/004017006000000138},
url = {http://dx.doi.org/10.1198/004017006000000138},
researchr = {https://researchr.org/publication/MeaseN06},
cites = {0},
citedby = {0},
journal = {Technometrics},
volume = {48},
number = {3},
pages = {399-410},
}