William Q. Meeker, Luis A. Escobar, Yili Hong. Using Accelerated Life Tests Results to Predict Product Field Reliability. Technometrics, 51(2):146-161, 2009. [doi]
@article{MeekerEH09,
title = {Using Accelerated Life Tests Results to Predict Product Field Reliability},
author = {William Q. Meeker and Luis A. Escobar and Yili Hong},
year = {2009},
doi = {10.1198/TECH.2009.0016},
url = {http://dx.doi.org/10.1198/TECH.2009.0016},
researchr = {https://researchr.org/publication/MeekerEH09},
cites = {0},
citedby = {0},
journal = {Technometrics},
volume = {51},
number = {2},
pages = {146-161},
}