Hamming Distance Based Reordering and Columnwise Bit Stuffing with Difference Vector: A Better Scheme for Test Data Compression with Run Length Based Codes

Usha S. Mehla, Kankar S. Dasgupta, Niranjan M. Devashrayee. Hamming Distance Based Reordering and Columnwise Bit Stuffing with Difference Vector: A Better Scheme for Test Data Compression with Run Length Based Codes. In VLSI Design 2010: 23rd International Conference on VLSI Design, 9th International Conference on Embedded Systems, Bangalore, India, 3-7 January 2010. pages 33-38, IEEE, 2010. [doi]

References

No references recorded for this publication.

Cited by

No citations of this publication recorded.