Double-Phase Adaptive Neural Network for Condition-Based Monitoring of p-GaN HEMT Under Repetitive Short-Circuit Stresses

Wenjuan Mei, Zhen Liu 0003, Chaowu Pan, Ouhang Li, Yuanzhang Su, Qi Zhou. Double-Phase Adaptive Neural Network for Condition-Based Monitoring of p-GaN HEMT Under Repetitive Short-Circuit Stresses. IEEE T. Instrumentation and Measurement, 72:1-11, 2023. [doi]

@article{MeiLPLSZ23,
  title = {Double-Phase Adaptive Neural Network for Condition-Based Monitoring of p-GaN HEMT Under Repetitive Short-Circuit Stresses},
  author = {Wenjuan Mei and Zhen Liu 0003 and Chaowu Pan and Ouhang Li and Yuanzhang Su and Qi Zhou},
  year = {2023},
  doi = {10.1109/TIM.2023.3291001},
  url = {https://doi.org/10.1109/TIM.2023.3291001},
  researchr = {https://researchr.org/publication/MeiLPLSZ23},
  cites = {0},
  citedby = {0},
  journal = {IEEE T. Instrumentation and Measurement},
  volume = {72},
  pages = {1-11},
}