Trap Dynamic Detection of GaN HEMT under Repetitive Short Circuit Degradation - researchr publication authors

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Wenjuan Mei, Chaowu Pan, Zhen Liu 0003, Yuanzhang Su, Yusong Mei, Qi Zhou. Trap Dynamic Detection of GaN HEMT under Repetitive Short Circuit Degradation. In IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2023, Kuala Lumpur, Malaysia, May 22-25, 2023. pages 1-6, IEEE, 2023. [doi]

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