Phil Meier, Kris Rohrmann, Marvin Sandner, Martin Streitenberger, Marcus Prochaska. Convolutional neural networks for robust angular measurement with xMR sensor arrays. In IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2019, Auckland, New Zealand, May 20-23, 2019. pages 1-6, IEEE, 2019. [doi]
@inproceedings{MeierRSSP19,
title = {Convolutional neural networks for robust angular measurement with xMR sensor arrays},
author = {Phil Meier and Kris Rohrmann and Marvin Sandner and Martin Streitenberger and Marcus Prochaska},
year = {2019},
doi = {10.1109/I2MTC.2019.8827051},
url = {https://doi.org/10.1109/I2MTC.2019.8827051},
researchr = {https://researchr.org/publication/MeierRSSP19},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2019, Auckland, New Zealand, May 20-23, 2019},
publisher = {IEEE},
isbn = {978-1-5386-3460-8},
}