Martin Melik-Merkumians, Alois Zoitl, Thomas Moser. Ontology-based fault diagnosis for industrial control applications. In Proceedings of 15th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2010, September 13-16, 2010, Bilbao, Spain. pages 1-4, IEEE, 2010. [doi]
@inproceedings{Melik-MerkumiansZM10,
title = {Ontology-based fault diagnosis for industrial control applications},
author = {Martin Melik-Merkumians and Alois Zoitl and Thomas Moser},
year = {2010},
doi = {10.1109/ETFA.2010.5641192},
url = {http://doi.ieeecomputersociety.org/10.1109/ETFA.2010.5641192},
researchr = {https://researchr.org/publication/Melik-MerkumiansZM10},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {Proceedings of 15th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2010, September 13-16, 2010, Bilbao, Spain},
publisher = {IEEE},
isbn = {978-1-4244-6848-5},
}