Laurent Mendizabal, Laurent Béchou, Yannick Deshayes, Frédéric Verdier, Yves Danto, Dominique Laffitte, Jean-Luc Goudard, F. Houé. Study of influence of failure modes on lifetime distribution prediction of 1.55 μm DFB Laser diodes using weak drift of monitored parameters during ageing tests. Microelectronics Reliability, 44(9-11):1337-1342, 2004. [doi]
@article{MendizabalBDVDLGH04,
title = {Study of influence of failure modes on lifetime distribution prediction of 1.55 μm DFB Laser diodes using weak drift of monitored parameters during ageing tests},
author = {Laurent Mendizabal and Laurent Béchou and Yannick Deshayes and Frédéric Verdier and Yves Danto and Dominique Laffitte and Jean-Luc Goudard and F. Houé},
year = {2004},
doi = {10.1016/j.microrel.2004.07.025},
url = {http://dx.doi.org/10.1016/j.microrel.2004.07.025},
researchr = {https://researchr.org/publication/MendizabalBDVDLGH04},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {44},
number = {9-11},
pages = {1337-1342},
}