Backside Failure Analysis of GaAs ICs after ESD tests - researchr publication authors

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Gaudenzio Meneghesso, A. Cocco, G. Mura, Simona Podda, Massimo Vanzi. Backside Failure Analysis of GaAs ICs after ESD tests. Microelectronics Reliability, 42(9-11):1293-1298, 2002. [doi]

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