Single-bit Laser Fault Model in NOR Flash Memories: Analysis and Exploitation - researchr publication authors

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Alexandre Menu, Jean-Max Dutertre, Jean-Baptiste Rigaud, Brice Colombier, Pierre-Alain Moëllic, Jean-Luc Danger. Single-bit Laser Fault Model in NOR Flash Memories: Analysis and Exploitation. In 17th Workshop on Fault Detection and Tolerance in Cryptography, FDTC 2020, Milan, Italy, September 13, 2020. pages 41-48, IEEE, 2020. [doi]

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