M. Ray Mercer. Logic Elements for Universally Testable Circuits. In Proceedings International Test Conference 1986, Washington, D.C., USA, September 1986. pages 493-497, IEEE Computer Society, 1986.
@inproceedings{Mercer86,
title = {Logic Elements for Universally Testable Circuits},
author = {M. Ray Mercer},
year = {1986},
tags = {testing, logic},
researchr = {https://researchr.org/publication/Mercer86},
cites = {0},
citedby = {0},
pages = {493-497},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C., USA, September 1986},
publisher = {IEEE Computer Society},
}