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Acquiring and processing light deflection maps for transparent object inspection

Johannes Meyer, Thomas Längle, Jürgen Beyerer. Acquiring and processing light deflection maps for transparent object inspection. In 2nd International Conference on Frontiers of Signal Processing, ICFSP 2016, Warsaw, Poland, October 15-17, 2016. pages 104-109, IEEE, 2016. [doi]

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Johannes Meyer

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Thomas Längle

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Jürgen Beyerer

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