Fred J. Meyer, Nohpill Park. Predicting Defect-Tolerant Yield in the Embedded Core Context. IEEE Transactions on Computers, 52(11):1470-1479, 2003. [doi]
@article{MeyerP03,
title = {Predicting Defect-Tolerant Yield in the Embedded Core Context},
author = {Fred J. Meyer and Nohpill Park},
year = {2003},
url = {http://csdl.computer.org/comp/trans/tc/2003/11/t1470abs.htm},
tags = {context-aware},
researchr = {https://researchr.org/publication/MeyerP03},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Computers},
volume = {52},
number = {11},
pages = {1470-1479},
}