Meng Miao, Shurong Dong, Mingliang Li, Jian Wu, Fei Ma, Jianfeng Zheng, Yan Han. A novel gate-suppression technique for ESD protection. Microelectronics Reliability, 52(8):1598-1601, 2012. [doi]
@article{MiaoDLWMZH12,
title = {A novel gate-suppression technique for ESD protection},
author = {Meng Miao and Shurong Dong and Mingliang Li and Jian Wu and Fei Ma and Jianfeng Zheng and Yan Han},
year = {2012},
doi = {10.1016/j.microrel.2011.09.025},
url = {http://dx.doi.org/10.1016/j.microrel.2011.09.025},
researchr = {https://researchr.org/publication/MiaoDLWMZH12},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {52},
number = {8},
pages = {1598-1601},
}