An experimental study of the thermally activated processes in polycrystalline silicon thin film transistors

L. Michalas, M. Exarchos, G. J. Papaioannou, Dimitrios N. Kouvatsos, Apostolos T. Voutsas. An experimental study of the thermally activated processes in polycrystalline silicon thin film transistors. Microelectronics Reliability, 47(12):2058-2064, 2007. [doi]