A temperature study of photosensitivity in SLS polycrystalline silicon TFTs

L. Michalas, A. Syntychaki, M. Koutsoureli, G. J. Papaioannou, Apostolos T. Voutsas. A temperature study of photosensitivity in SLS polycrystalline silicon TFTs. Microelectronics Reliability, 52(9-10):2508-2511, 2012. [doi]

Authors

L. Michalas

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A. Syntychaki

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M. Koutsoureli

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G. J. Papaioannou

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Apostolos T. Voutsas

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