Retrieving the parameters of cryo Electron Microscopy dataset in the heterogeneous ab-initio case

Yves Michels, Etienne Baudrier. Retrieving the parameters of cryo Electron Microscopy dataset in the heterogeneous ab-initio case. In 2016 IEEE International Conference on Image Processing, ICIP 2016, Phoenix, AZ, USA, September 25-28, 2016. pages 3189-3193, IEEE, 2016. [doi]

Authors

Yves Michels

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Etienne Baudrier

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