Sinogram Denoising of Cryo-Electron Microscopy Images

Taneli Mielikäinen, Janne Ravantti. Sinogram Denoising of Cryo-Electron Microscopy Images. In Osvaldo Gervasi, Marina L. Gavrilova, Vipin Kumar, Antonio Laganà, Heow Pueh Lee, Youngsong Mun, David Taniar, Chih Jeng Kenneth Tan, editors, Computational Science and Its Applications - ICCSA 2005, International Conference, Singapore, May 9-12, 2005, Proceedings, Part IV. Volume 3483 of Lecture Notes in Computer Science, pages 1251-1261, Springer, 2005. [doi]

@inproceedings{MielikainenR05,
  title = {Sinogram Denoising of Cryo-Electron Microscopy Images},
  author = {Taneli Mielikäinen and Janne Ravantti},
  year = {2005},
  doi = {10.1007/11424925_130},
  url = {http://dx.doi.org/10.1007/11424925_130},
  researchr = {https://researchr.org/publication/MielikainenR05},
  cites = {0},
  citedby = {0},
  pages = {1251-1261},
  booktitle = {Computational Science and Its Applications - ICCSA 2005, International Conference, Singapore, May 9-12, 2005, Proceedings, Part IV},
  editor = {Osvaldo Gervasi and Marina L. Gavrilova and Vipin Kumar and Antonio Laganà and Heow Pueh Lee and Youngsong Mun and David Taniar and Chih Jeng Kenneth Tan},
  volume = {3483},
  series = {Lecture Notes in Computer Science},
  publisher = {Springer},
  isbn = {3-540-25863-9},
}