Guiding Random Test Generation for Intra-class Dataflow Coverage

Petru Florin Mihancea, Edit Mercedes Mera-Batiz, Marius Minea. Guiding Random Test Generation for Intra-class Dataflow Coverage. In Franz Winkler, Viorel Negru, Tetsuo Ida, Tudor Jebelean, Dana Petcu, Stephen M. Watt, Daniela Zaharie, editors, 16th International Symposium on Symbolic and Numeric Algorithms for Scientific Computing, SYNASC 2014, Timisoara, Romania, September 22-25, 2014. pages 149-155, IEEE, 2014. [doi]

@inproceedings{MihanceaMM14,
  title = {Guiding Random Test Generation for Intra-class Dataflow Coverage},
  author = {Petru Florin Mihancea and Edit Mercedes Mera-Batiz and Marius Minea},
  year = {2014},
  doi = {10.1109/SYNASC.2014.28},
  url = {http://doi.ieeecomputersociety.org/10.1109/SYNASC.2014.28},
  researchr = {https://researchr.org/publication/MihanceaMM14},
  cites = {0},
  citedby = {0},
  pages = {149-155},
  booktitle = {16th International Symposium on Symbolic and Numeric Algorithms for Scientific Computing, SYNASC 2014, Timisoara, Romania, September 22-25, 2014},
  editor = {Franz Winkler and Viorel Negru and Tetsuo Ida and Tudor Jebelean and Dana Petcu and Stephen M. Watt and Daniela Zaharie},
  publisher = {IEEE},
  isbn = {978-1-4799-8448-0},
}