Alejandro Millán, Jorge Juan, Manuel J. Bellido, David Guerrero, Paulino Ruiz-de-Clavijo, Julian Viejo. Power Dissipation Associated to Internal Effect Transitions in Static CMOS Gates. In Lars Svensson, José Monteiro, editors, Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation, 18th International Workshop, PATMOS 2008, Lisbon, Portugal, September 10-12, 2008. Revised Selected Papers. Volume 5349 of Lecture Notes in Computer Science, pages 389-398, Springer, 2008. [doi]
@inproceedings{MillanJBGRV08,
title = {Power Dissipation Associated to Internal Effect Transitions in Static CMOS Gates},
author = {Alejandro Millán and Jorge Juan and Manuel J. Bellido and David Guerrero and Paulino Ruiz-de-Clavijo and Julian Viejo},
year = {2008},
doi = {10.1007/978-3-540-95948-9_39},
url = {http://dx.doi.org/10.1007/978-3-540-95948-9_39},
researchr = {https://researchr.org/publication/MillanJBGRV08},
cites = {0},
citedby = {0},
pages = {389-398},
booktitle = {Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation, 18th International Workshop, PATMOS 2008, Lisbon, Portugal, September 10-12, 2008. Revised Selected Papers},
editor = {Lars Svensson and José Monteiro},
volume = {5349},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {978-3-540-95947-2},
}