Ryo Minami, Jee Young Hong, Kenichi Okada, Akira Matsuzawa. Measurement of Integrated PA-to-LNA Isolation on Si CMOS Chip. IEICE Transactions, 94-C(6):1057-1060, 2011. [doi]
@article{MinamiHOM11,
title = {Measurement of Integrated PA-to-LNA Isolation on Si CMOS Chip},
author = {Ryo Minami and Jee Young Hong and Kenichi Okada and Akira Matsuzawa},
year = {2011},
url = {http://search.ieice.org/bin/summary.php?id=e94-c_6_1057},
researchr = {https://researchr.org/publication/MinamiHOM11},
cites = {0},
citedby = {0},
journal = {IEICE Transactions},
volume = {94-C},
number = {6},
pages = {1057-1060},
}