Approximate Log-Hilbert-Schmidt Distances between Covariance Operators for Image Classification

Ha Quang Minh, Marco San-Biagio, Loris Bazzani, Vittorio Murino. Approximate Log-Hilbert-Schmidt Distances between Covariance Operators for Image Classification. In 2016 IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2016, Las Vegas, NV, USA, June 27-30, 2016. pages 5195-5203, IEEE Computer Society, 2016. [doi]

Authors

Ha Quang Minh

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Marco San-Biagio

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Loris Bazzani

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Vittorio Murino

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