A built-in self-testing framework for asynchronous bundled-data NoC switches resilient to delay variations

Gabriele Miorandi, Alberto Celin, Michele Favalli, Davide Bertozzi. A built-in self-testing framework for asynchronous bundled-data NoC switches resilient to delay variations. In Tenth IEEE/ACM International Symposium on Networks-on-Chip, NOCS 2016, Nara, Japan, August 31 - September 2, 2016. pages 1-8, IEEE, 2016. [doi]

Authors

Gabriele Miorandi

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Alberto Celin

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Michele Favalli

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Davide Bertozzi

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