Shahrzad Mirkhani, Meisam Lavasani, Zainalabedin Navabi. Hierarchical Fault Simulation Using Behavioral and Gate Level Hardware Models. In 11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA. pages 374, IEEE Computer Society, 2002. [doi]
@inproceedings{MirkhaniLN02, title = {Hierarchical Fault Simulation Using Behavioral and Gate Level Hardware Models}, author = {Shahrzad Mirkhani and Meisam Lavasani and Zainalabedin Navabi}, year = {2002}, url = {http://csdl.computer.org/comp/proceedings/ats/2002/1825/00/18250374abs.htm}, researchr = {https://researchr.org/publication/MirkhaniLN02}, cites = {0}, citedby = {0}, pages = {374}, booktitle = {11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA}, publisher = {IEEE Computer Society}, isbn = {0-7695-1825-7}, }