Test Data Generation for Mutation Testing Using Genetic Algorithm

Deepti Bala Mishra, Rajashree Mishra, Arup Abhinna Acharya, Kedar Nath Das. Test Data Generation for Mutation Testing Using Genetic Algorithm. In Jagdish Chand Bansal, Kedar Nath Das, Atulya Nagar, Kusum Deep, Akshay Kumar Ojha, editors, Soft Computing for Problem Solving - SocProS 2017, Volume 2, Bhubaneswar, India, December 23-24, 2017. Volume 817 of Advances in Intelligent Systems and Computing, pages 857-867, Springer, 2017. [doi]

@inproceedings{MishraMAD17,
  title = {Test Data Generation for Mutation Testing Using Genetic Algorithm},
  author = {Deepti Bala Mishra and Rajashree Mishra and Arup Abhinna Acharya and Kedar Nath Das},
  year = {2017},
  doi = {10.1007/978-981-13-1595-4_68},
  url = {https://doi.org/10.1007/978-981-13-1595-4_68},
  researchr = {https://researchr.org/publication/MishraMAD17},
  cites = {0},
  citedby = {0},
  pages = {857-867},
  booktitle = {Soft Computing for Problem Solving - SocProS 2017, Volume 2, Bhubaneswar, India, December 23-24, 2017},
  editor = {Jagdish Chand Bansal and Kedar Nath Das and Atulya Nagar and Kusum Deep and Akshay Kumar Ojha},
  volume = {817},
  series = {Advances in Intelligent Systems and Computing},
  publisher = {Springer},
  isbn = {978-981-13-1595-4},
}