Yoshiki Mitani, Tomoko Matsumura, Mike Barker, Seishiro Tsuruho, Katsuro Inoue, Ken-ichi Matsumoto. An Empirical Study of Process and Product Metrics Based on In-process Measurements of a Standardized Requirements Definition Phase. In Juan Jose Cuadrado-Gallego, René Braungarten, Reiner R. Dumke, Alain Abran, editors, Software Process and Product Measurement, International Conference, IWSM-Mensura 2007, Palma de Mallorca, Spain, November 5-8, 2007. Revised Papers. Volume 4895 of Lecture Notes in Computer Science, pages 46-59, Springer, 2007. [doi]
@inproceedings{MitaniMBTIM07:0,
title = {An Empirical Study of Process and Product Metrics Based on In-process Measurements of a Standardized Requirements Definition Phase},
author = {Yoshiki Mitani and Tomoko Matsumura and Mike Barker and Seishiro Tsuruho and Katsuro Inoue and Ken-ichi Matsumoto},
year = {2007},
doi = {10.1007/978-3-540-85553-8_4},
url = {http://dx.doi.org/10.1007/978-3-540-85553-8_4},
tags = {empirical, rule-based},
researchr = {https://researchr.org/publication/MitaniMBTIM07%3A0},
cites = {0},
citedby = {0},
pages = {46-59},
booktitle = {Software Process and Product Measurement, International Conference, IWSM-Mensura 2007, Palma de Mallorca, Spain, November 5-8, 2007. Revised Papers},
editor = {Juan Jose Cuadrado-Gallego and René Braungarten and Reiner R. Dumke and Alain Abran},
volume = {4895},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {978-3-540-85552-1},
}