Steven W. Mittl, Fernando Guarin. Self-heating and its implications on hot carrier reliability evaluations. In IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015. pages 4, IEEE, 2015. [doi]
@inproceedings{MittlG15,
title = {Self-heating and its implications on hot carrier reliability evaluations},
author = {Steven W. Mittl and Fernando Guarin},
year = {2015},
doi = {10.1109/IRPS.2015.7112726},
url = {http://dx.doi.org/10.1109/IRPS.2015.7112726},
researchr = {https://researchr.org/publication/MittlG15},
cites = {0},
citedby = {0},
pages = {4},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015},
publisher = {IEEE},
isbn = {978-1-4673-7362-3},
}