Evaluation of Time Sample Replacement Scheme in OFDM System Using NU-QAM Under Impulsive Noise Environment

Haru Miura, Akira Nakamura, Makoto Itami. Evaluation of Time Sample Replacement Scheme in OFDM System Using NU-QAM Under Impulsive Noise Environment. In IEEE International Conference on Consumer Electronics, ICCE 2023, Las Vegas, NV, USA, January 6-8, 2023. pages 1-4, IEEE, 2023. [doi]

Authors

Haru Miura

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Akira Nakamura

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Makoto Itami

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