Osamu Mizuno, Hideaki Hata. An Empirical Comparison of Fault-Prone Module Detection Approaches: Complexity Metrics and Text Feature Metrics. In Sheikh Iqbal Ahamed, Doo-Hwan Bae, Sung Deok Cha, Carl K. Chang, Rajesh Subramanyan, Eric Wong, Hen-I Yang, editors, Proceedings of the 34th Annual IEEE International Computer Software and Applications Conference, COMPSAC 2010, Seoul, Korea, 19-23 July 2010. pages 248-249, IEEE Computer Society, 2010. [doi]
@inproceedings{MizunoH10-0, title = {An Empirical Comparison of Fault-Prone Module Detection Approaches: Complexity Metrics and Text Feature Metrics}, author = {Osamu Mizuno and Hideaki Hata}, year = {2010}, doi = {10.1109/COMPSAC.2010.30}, url = {http://dx.doi.org/10.1109/COMPSAC.2010.30}, tags = {empirical, systematic-approach}, researchr = {https://researchr.org/publication/MizunoH10-0}, cites = {0}, citedby = {0}, pages = {248-249}, booktitle = {Proceedings of the 34th Annual IEEE International Computer Software and Applications Conference, COMPSAC 2010, Seoul, Korea, 19-23 July 2010}, editor = {Sheikh Iqbal Ahamed and Doo-Hwan Bae and Sung Deok Cha and Carl K. Chang and Rajesh Subramanyan and Eric Wong and Hen-I Yang}, publisher = {IEEE Computer Society}, isbn = {978-0-7695-4085-6}, }