Abdul Jalil Mohamed, Otman Basir. A new probing scheme for fault detection and identification. In 2009 IEEE International Conference on Electro/Information Technology, EIT 2009, Windsor, Ontario, Canada, June 7-9, 2009. pages 90-95, IEEE, 2009. [doi]
@inproceedings{MohamedB09,
title = {A new probing scheme for fault detection and identification},
author = {Abdul Jalil Mohamed and Otman Basir},
year = {2009},
doi = {10.1109/EIT.2009.5189590},
url = {http://dx.doi.org/10.1109/EIT.2009.5189590},
researchr = {https://researchr.org/publication/MohamedB09},
cites = {0},
citedby = {0},
pages = {90-95},
booktitle = {2009 IEEE International Conference on Electro/Information Technology, EIT 2009, Windsor, Ontario, Canada, June 7-9, 2009},
publisher = {IEEE},
isbn = {978-1-4244-3355-1},
}