Mechanical Strain Measurements Using Semiconductor Piezoresistive Material - researchr publication authors

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Ahmed A. S. Mohammed, Walied A. Moussa, Edmond Lou. Mechanical Strain Measurements Using Semiconductor Piezoresistive Material. In 2006 International Conference on MEMS, NANO and Smart Systems, ICMENS 2006, Cairo, Egypt, December 27-29, 2006. pages 5-6, IEEE, 2006. [doi]

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