Saraju P. Mohanty, Elias Kougianos. Steady and Transient State Analysis of Gate Leakage Current in Nanoscale CMOS Logic Gates. In 24th International Conference on Computer Design (ICCD 2006), 1-4 October 2006, San Jose, CA, USA. pages 210-215, IEEE, 2006. [doi]
@inproceedings{MohantyK06:0,
title = {Steady and Transient State Analysis of Gate Leakage Current in Nanoscale CMOS Logic Gates},
author = {Saraju P. Mohanty and Elias Kougianos},
year = {2006},
url = {http://www.iccd-conference.org/proceedings/2006/paper_15.pdf},
tags = {analysis, logic},
researchr = {https://researchr.org/publication/MohantyK06%3A0},
cites = {0},
citedby = {0},
pages = {210-215},
booktitle = {24th International Conference on Computer Design (ICCD 2006), 1-4 October 2006, San Jose, CA, USA},
publisher = {IEEE},
}