Power and Thermal Cycling Testbed for End of Life Assessment of Semiconductor Devices - researchr publication authors

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Margo Molenaar, Faezeh Kardan, Aditya Shekhar, Pavol Bauer. Power and Thermal Cycling Testbed for End of Life Assessment of Semiconductor Devices. In 49th Annual Conference of the IEEE Industrial Electronics Society, IECON 2023, Singapore, October 16-19, 2023. pages 1-6, IEEE, 2023. [doi]

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