Defect detection oriented lifecycle modeling in complex product development

Jan van Moll, Jef Jacobs, Rob J. Kusters, Jos J. M. Trienekens. Defect detection oriented lifecycle modeling in complex product development. Information \& Software Technology, 46(10):665-675, 2004. [doi]

Authors

Jan van Moll

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Jef Jacobs

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Rob J. Kusters

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Jos J. M. Trienekens

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