Symbolic-Event-Propagation-Based Minimal Test Set Generation for Robust Path Delay Faults

Arijit Mondal, P. P. Chakrabarti, Pallab Dasgupta. Symbolic-Event-Propagation-Based Minimal Test Set Generation for Robust Path Delay Faults. ACM Trans. Design Autom. Electr. Syst., 17(4):47, 2012. [doi]

@article{MondalCD12,
  title = {Symbolic-Event-Propagation-Based Minimal Test Set Generation for Robust Path Delay Faults},
  author = {Arijit Mondal and P. P. Chakrabarti and Pallab Dasgupta},
  year = {2012},
  doi = {10.1145/2348839.2348851},
  url = {http://doi.acm.org/10.1145/2348839.2348851},
  researchr = {https://researchr.org/publication/MondalCD12},
  cites = {0},
  citedby = {0},
  journal = {ACM Trans. Design Autom. Electr. Syst.},
  volume = {17},
  number = {4},
  pages = {47},
}