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Temperature Dependence of Subthreshold Characteristics of Negative Capacitance Recessed-Source/Drain (NC R-S/D) SOI MOSFET

Sandeep Moparthi, Pramod Kumar Tiwari, Visweswara Rao Samoju, Gopi Krishna Saramekala. Temperature Dependence of Subthreshold Characteristics of Negative Capacitance Recessed-Source/Drain (NC R-S/D) SOI MOSFET. In IEEE International Symposium on Smart Electronic Systems, iSES 2019 (Formerly iNiS), Rourkela, India, December 16-18, 2019. pages 386-389, IEEE, 2019. [doi]

Authors

Sandeep Moparthi

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Pramod Kumar Tiwari

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Visweswara Rao Samoju

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Gopi Krishna Saramekala

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