Demagnetization analysis of an open-end windings 5-phase PMSM under transistor short-circuit fault

Tiago José dos Santos Moraes, Eric Semail, Ngac Ky Nguyen. Demagnetization analysis of an open-end windings 5-phase PMSM under transistor short-circuit fault. In IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society, Lisbon, Portugal, October 14-17, 2019. pages 6206-6211, IEEE, 2019. [doi]

@inproceedings{MoraesSN19,
  title = {Demagnetization analysis of an open-end windings 5-phase PMSM under transistor short-circuit fault},
  author = {Tiago José dos Santos Moraes and Eric Semail and Ngac Ky Nguyen},
  year = {2019},
  doi = {10.1109/IECON.2019.8927205},
  url = {https://doi.org/10.1109/IECON.2019.8927205},
  researchr = {https://researchr.org/publication/MoraesSN19},
  cites = {0},
  citedby = {0},
  pages = {6206-6211},
  booktitle = {IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society, Lisbon, Portugal, October 14-17, 2019},
  publisher = {IEEE},
  isbn = {978-1-7281-4878-6},
}